A Generalized Formulation for Permittivity Extraction of Low-to-High-Loss Materials From Transmission Measurement

HASAR U. C.

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, cilt.58, sa.2, ss.411-418, 2010 (SCI-Expanded, Scopus) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 58 Sayı: 2
  • Basım Tarihi: 2010
  • Doi Numarası: 10.1109/tmtt.2009.2038443
  • Dergi Adı: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.411-418
  • Anahtar Kelimeler: Materials testing, microwave measurements, permittivity, DETERMINING COMPLEX PERMITTIVITY, AUTOMATIC NETWORK ANALYZER, WAVE-GUIDE MEASUREMENTS, REFLECTION METHOD, BROAD-BAND, CONSTITUTIVE PARAMETERS, DIELECTRIC MATERIALS, INTRINSIC-PROPERTIES, LIQUID MATERIALS, DAVIDENKO METHOD
  • Atatürk Üniversitesi Adresli: Evet

Özet

We have derived a one-variable metric function for fast computations of the relative complex permittivity of low-to-high-loss materials from S-21 measurement at one frequency. We present how this function can be applied for different applications (e.g., relative complex permittivity measurement of a thin low-loss material). In addition, it can be applied as a measurement tool in broadband applications for samples with substantiate lengths, which demonstrate low-loss property at lower frequency bands and high-loss property at higher frequency bands. The derived expressions can work very well in limited frequency-band applications or for dispersive materials since it is based on point-by-point (or frequency-by-frequency) extraction. We measured the relative complex permittivity of two test samples (a low- and high-loss sample) for validation of the derived expressions.