Determination of chilling temperature effects on inorganic element composition and distribution in beans (Phaseolus vulgaris L.) using WDXRF-spectroscopic technique

Dumlupinar R., DEMIR F., Bostan H.

FRESENIUS ENVIRONMENTAL BULLETIN, cilt.16, sa.5, ss.548-554, 2007 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 16 Sayı: 5
  • Basım Tarihi: 2007
  • Dergi Adı: FRESENIUS ENVIRONMENTAL BULLETIN
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.548-554
  • Atatürk Üniversitesi Adresli: Evet

Özet

Bean seedlings (Phaseolus vulgaris cv. Gina 2004) were exposed to chilling temperatures. Subsequently, plants were cut into root tip, root middle part, root upper part, hypocotyl, epicotyl, petiole and leaf and sampled randomly. Concentrations of inorganic elements (Si, P, S, Cl, K, Ca, Fe, Cu) were measured, by wavelength-dispersive X-ray fluorescence (WDXRF) spectrometry. The aim of the study was to apply WDXRF method for the determination of inorganic element levels in organs of bean plants, and develop a non-destructive method that is easier and safer than chemical analysis for collecting data. Results indicated compositional differences in inorganic elements among organs of bean at chilling temperatures compared to control. We hypothesize that, in certain bean parts, the distribution and accumulation of these elements may be a response to a chilling stress in the bean. In addition, we suggest here that the WDXRF technique is easier and safer than the traditional chemical techniques for determination of organic elements in plants.