The temperature dependence of current-voltage characteristics of CuAuAg/n-Si/Ti Schottky diode

Orhan Z., Taşer A., Güzeldir B., Sağlam M.

Materials Today: Proceedings, cilt.46, ss.6924-6928, 2021 (Scopus) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 46
  • Basım Tarihi: 2021
  • Doi Numarası: 10.1016/j.matpr.2021.01.560
  • Dergi Adı: Materials Today: Proceedings
  • Derginin Tarandığı İndeksler: Scopus, INSPEC
  • Sayfa Sayıları: ss.6924-6928
  • Anahtar Kelimeler: Schottky contacts, Barrier inhomogeneities, CuAuAg alloys, Sample temperature, Series resistance, ELECTRON-TRANSPORT
  • Atatürk Üniversitesi Adresli: Evet

Özet

CuAuAg/n-Si/Ti diode has been fabricated and temperature dependences of current voltage (I-V) characteristics have been analyzed based on thermionic emission (TE) theory in the temperature range of 80- 300 K. The electronic parameters such as, ideality factor, barrier height and series resistance were calculated. It is found that the values of the ideality factor increase and barrier height decrease with decreasing temperature. The ideality factor and barrier height values as a function of the sample temperature have been attributed to the presence of the lateral inhomogeneities of the barrier height. (c) 2021 Elsevier Ltd. Selection and peer-review under responsibility of the scientific committee of the International Congress on Semiconductor Materials and Devices, ICSMD2018.