Simpler Reference-Plane-Invariant Method for Permittivity Extraction of Medium- or Low-Loss Dielectric Samples Using One-Port Measurements

Cem Hasar U., Ali H., KAYA Y., Stoyanov I.

IEEE Access, cilt.12, ss.151063-151074, 2024 (SCI-Expanded, Scopus) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 12
  • Basım Tarihi: 2024
  • Doi Numarası: 10.1109/access.2024.3479311
  • Dergi Adı: IEEE Access
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.151063-151074
  • Anahtar Kelimeler: Solids, Economic indicators, Permittivity measurement, Calibration, Reflection, Permittivity, Liquids, Iterative methods, Electromagnetics, Accuracy, Material characterization, non-iterative, one-port measurement, permittivity, short-termination
  • Atatürk Üniversitesi Adresli: Hayır

Özet

A microwave method is devised to extract relative complex permittivity (ϵr) of medium- or low-loss dielectric samples. It is simpler, non-iterative, reference-plane-invariant (RPI), and applicable for one-port waveguide measurements with short-circuit termination only. Besides, since it uses short-circuit termination reflection-only measurements, it is free from Fabry-Pérot resonances. Permittivity measurements of polyvinyl chloride (PVC) and polypropylene (PP) are performed at X-band (8.2-12.4 GHz) to examine the performance of the proposed method considering different scenarios involving inaccurate information of sample location in the cell and inaccurate knowledge of the sample thickness. Repeatability analysis is carried out to analyze the performance of the proposed method against other similar methods in the literature.