Permittivity Extraction of Electrically Thin Samples by Reflection-Only Free-Space Measurements

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Hasar U. C., Xue B., Ozturk H., KAYA Y., ÖZTÜRK G.

IEEE MICROWAVE AND WIRELESS TECHNOLOGY LETTERS, 2026 (SCI-Expanded, Scopus)

• Yayın Türü: Makale / Tam Makale
• Basım Tarihi: 2026
• Doi Numarası: 10.1109/lmwt.2026.3664890
• Dergi Adı: IEEE MICROWAVE AND WIRELESS TECHNOLOGY LETTERS
• Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
• Atatürk Üniversitesi Adresli: Evet

Özet

A permittivity extraction procedure is devised for electrically thin samples from reflection-only free-space measurements. Unlike previous studies, this procedure relies on sample-back metal termination measurements especially useful for thinner samples. An objective function independent of antenna transmission characteristics and reference plane position is derived. Minimum and maximum thickness and permittivity values for which our method is applicable are also examined. Free-space measurements at X-band (8.2-12.4 GHz) of a Rogers 4350B sample (approximate to 1.52 mm) and a FR4 sample (approximate to 1.60 mm) were performed to validate our method with a dielectric constant less than 5% variation.