Simple procedure for robust and accurate complex permittivity measurements of low-loss materials over a broad frequency band

Hasar U. C., Barroso J. J., Kaya Y., Bute M., ERTUĞRUL M.

JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS, cilt.28, sa.8, ss.903-915, 2014 (SCI-Expanded, Scopus) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 28 Sayı: 8
  • Basım Tarihi: 2014
  • Doi Numarası: 10.1080/09205071.2014.896227
  • Dergi Adı: JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.903-915
  • Anahtar Kelimeler: materials testing, low-loss samples, permittivity, microwave measurements
  • Atatürk Üniversitesi Adresli: Evet

Özet

In this research paper, we propose a simple procedure for accurate, stable and broadband measurements of complex permittivity of low-loss dielectric samples with considerable lengths. We identify and demonstrate by numerical and analytical analyses the main ill-behaved factor that gives rise to inaccurate peaks for measurements of electrical properties of low-loss samples in the well-known Nicolson-Ross-Weir method. Without using this factor in the expressions and combining better features of the methods available in the literature, the proposed procedure allows highly accurate permittivity measurements over a broad band. We have validated the proposed method by permittivity measurements of a low-loss sample by different methods.