Akademik Veri Yönetim Sistemi
APPLIED SPECTROSCOPY REVIEWS, cilt.31, sa.3, ss.321-332, 1996 (SCI-Expanded)
A Monte Carlo (MC) computer program for the calculation of the distribution of characteristic X-ray intensities as a function of the counting geometry is described. The program evaluates the contribution to the intensities of a fluorescent line from each point of the source, sample and detector. The nain considerations of the calculation are based on the critical nature of the internal geometry of the main analyzer components within an energy dispersive X-ray fluorescence (EDXRF) spectrometer. The K XRF intensities for the inner and outer radius of the annular-sample and collimator radius were measured. An optimum geometry can be obtained by varying the collimator radius and the detector-sample distance. The results of the calculations show that the intensity distribution of the radioisotope excited fluorescent radiation through annular sample area is strongly dependent on the collimator radius, with a maximum intensity effect with a smaller sample area and with decreasing collimator radius. An investigation of the XRF intensities in the annular sample surface as a function of collimator radius is discussed.