Influence of deposition conditions on nanostructured InSe thin films


Demir K., Demir E., Yuksel S., COŞKUN C.

CURRENT APPLIED PHYSICS, cilt.19, sa.12, ss.1404-1413, 2019 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 19 Sayı: 12
  • Basım Tarihi: 2019
  • Doi Numarası: 10.1016/j.cap.2019.09.008
  • Dergi Adı: CURRENT APPLIED PHYSICS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.1404-1413
  • Anahtar Kelimeler: Indium selenide, Electrodeposition, X-ray diffraction, Atomic force microscopy, Raman spectroscopy, CHEMICAL-VAPOR-DEPOSITION, INDIUM SELENIDE, OPTICAL-PROPERTIES, ELECTRICAL-PROPERTIES, EVAPORATED INDIUM, SINGLE-CRYSTALS, IN2SE3, ALPHA-IN2SE3, GROWTH
  • Atatürk Üniversitesi Adresli: Evet

Özet

In this study, nanostructured indium selenide (InSe) thin films were deposited on Indium fin oxide (ITO)-coated glass substrate using electrochemical deposition (ECD) from aqueous solution containing In(SO4)(3)center dot H2O and SeO2. The effects of deposition potential ( - 0.70 to -1.35 V), time (30-3600 s), temperature (25-80 degrees C) and pH (2.58 for A samples; 2 for B samples and 1.45 for C samples) on growth of the InSe thin films were examined in terms of their structural, morphological and optical properties. X-ray diffraction (XRD) analysis confirmed that the InSe thin films are in polycrystalline structure. It was found that the values of grain size decreased and the full width half maximum (FWHM) values increased with the increasing deposition potential. According to the absorption measurements, optical properties of the thin films varied with changes in deposition conditions. Based on the atomic force microscopy (AFM) and the scanning electron microscopy (SEM) images, surface morphology of the thin films was influenced by deposition potential and pH of the electrolyte, and non-homogeneous depositions distributed across the entire surface were observed. In addition, Raman spectroscopy, X-ray photoelectron spectroscopy (XPS) and fourier transform infrared spectroscopy (FT-IR) analyses were used to further examine crystal quality, vibration, chemical binding conditions, In/Se orientation and structure of the prepared InSe thin films. When Raman results are examined, the B12 sample shows a more intensity and narrow peak at 248 cm(-1). XPS measurements sowed that A6 sample exhibited more growth in low potential for a long time and better film stoichiometry compared to the other three samples. Also, FT-IR studies prove the presence of InSe. According to the results, the film did not form at low temperatures and short times. However, the film formation began with the increasing deposition temperature and time at the low potential value of - 0.730 V. But, it is clear that a high quality film can be obtained in cathodic potential with -1.3 V and shorter deposition time with 300 s at room temperature respectively. Overall results showed that the high quality thin films can be obtained by the ECD technique. However, deposition conditions must be sensitively adjusted to control morphology of the electrodeposited nanoparticles.