PARAMETER EXTRACTION FROM NONIDEAL C-V CHARACTERISTICS OF A SCHOTTKY DIODE WITH AND WITHOUT INTERFACIAL LAYER

TURUT A., YALCIN N., SAGLAM M.

SOLID-STATE ELECTRONICS, cilt.35, sa.6, ss.835-841, 1992 (SCI-Expanded, Scopus) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 35 Sayı: 6
  • Basım Tarihi: 1992
  • Doi Numarası: 10.1016/0038-1101(92)90286-l
  • Dergi Adı: SOLID-STATE ELECTRONICS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.835-841
  • Atatürk Üniversitesi Adresli: Evet

Özet

In this study, we have attempted to interpret experimentally observed non-ideal Al-pSi Schottky diode I-V and C-2-V characteristics which are due to an interface layer, interface states and fixed surface charge. A value of 0.68 eV for the barrier height q-PHI(Bo) for Al-pSi diodes without interface layer and fixed surface charge has been obtained from C-2-V characteristics and a value of 0.20 eV for the neutral level of the surface states has been found. Furthermore, the value of the barrier height q-PHI(Bp) without fixed surface charge and the effective barrier height q-PHI(Bp,o) are separately obtained from C-2-V characteristics. In addition, values of interface state density D(it) have been calculated.