Structural Characterization of InSe:Zn Binary Semiconductor Grown By Bridgman/Stockbarger Technique THALES International Journal of Thales Engineering Sciences (Jthes) Issn (Online): 2149-5297 18-28, 2016.

GÜRBULAK B., ASHKHASİ A., ŞATA M., ÖZÇELİK Ş., DUMAN S.

International Journal of Thales Engineering Sciences (Jthes), 2016 (Hakemli Dergi)