Structural Characterization of InSe:Zn Binary Semiconductor Grown By Bridgman/Stockbarger Technique THALES International Journal of Thales Engineering Sciences (Jthes) Issn (Online): 2149-5297 18-28, 2016.

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Atıf İçin Kopyala

GÜRBULAK B., ASHKHASİ A., ŞATA M., ÖZÇELİK Ş., DUMAN S.

International Journal of Thales Engineering Sciences (Jthes), 2016 (Hakemli Dergi)

• Yayın Türü: Makale / Tam Makale
• Basım Tarihi: 2016
• Dergi Adı: International Journal of Thales Engineering Sciences (Jthes)
• Atatürk Üniversitesi Adresli: Evet