Investigation of Surface Topography of GaTe and GaTe:CdSemiconductors using Atomic Force Microscopy

ŞATA M., karataş s., ERZENEOĞLU S. Z., TURGUT G., GÜRBULAK B.

the International Conference onPhysical Chemistry and Functional Materials(PCFM’18)EditorsNiyazi Bulut, PhDPublished, June, 19 - 21 Haziran 2018

  • Yayın Türü: Bildiri / Özet Bildiri
  • Atatürk Üniversitesi Adresli: Evet