Determination of the Structural Properties of NiCr2O4 and Ti Dopped NiCr2O4 Thin Films Grown byRadio Frequency Sputtering Technique (RF) and Gas Sensor Application


TURGUT E. , SARITAŞ S. , YILDIRIM M. , GÜR E.

3rd International Conference on AdvancedEngineering Technologies, Bayburt, Turkey, 19 - 21 September 2019, pp.1226-1229

  • Publication Type: Conference Paper / Full Text
  • City: Bayburt
  • Country: Turkey
  • Page Numbers: pp.1226-1229