Investigation of Surface Topography of GaTe and GaTe:CdSemiconductors using Atomic Force Microscopy

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ŞATA M., karataş s., ERZENEOĞLU S. Z., TURGUT G., GÜRBULAK B.

the International Conference onPhysical Chemistry and Functional Materials(PCFM’18)EditorsNiyazi Bulut, PhDPublished, June, 19 - 21 Haziran 2018, (Özet Bildiri)

• Yayın Türü: Bildiri / Özet Bildiri
• Atatürk Üniversitesi Adresli: Evet