The Effect Of Annealing On The Electrical Characterization Of Cu n Type InP Schottky Diodes C V Measurements As A Function Of Sample Tempertature

CİMİLLİ ÇATIR F. E., SAĞLAM M., Abdülmecit T.

International Physics Conference At The Anatolian Peak (IPCAP 2016), 25-27 February 2016, Erzurum, TURKEY., 25 - 27 Şubat 2016

  • Yayın Türü: Bildiri / Özet Bildiri
  • Atatürk Üniversitesi Adresli: Evet